Scanning Near-field Optical Microscope(SNOM)

2016-0203-04
researcher's name
affiliation
research field
Thin film/Surface and interfacial physical properties,Nanostructural chemistry,Physical chemistry
keyword

background

● Limited to transparent sample and single wavelength measurement. Poor signal to noise ratio

summary

● Spectroscopic evaluations with a nanometer spatial resolution are possible
● Extended from single channel measurements to multiplex measurements
● Wide spectral range with highly accurate measurements are achievable
● Applicable to opaque samples as well as transparent ones

predominance

● Super-resolution beyond the diffraction limit is achievable
● Evaluation of material properties with wide spectral range
● Applicable  to a conventional apparatus

remarks

High contrast imaging with a nanometer spatial resolution is  possible even for opaque samples


material

  • Comparison of near-field reflection spectra taken by conventional and developed microscopes
  • Comparison of near-field reflection images taken by conventional and developed microscopes
  • Comparison between observed and calculated spectra

collaborative researchers

溝端 秀聡 (理工学術院　化学・生命化学科)

same researcher's seeds

posted: 2016/02/03