Scanning Near-field Optical Microscope(SNOM)

researcher's name
about researcher IMURA, Kohei Professor
Faculty of Science and Engineering School of Advanced Science and Engineering
research field
Thin film/Surface and interfacial physical properties,Nanostructural chemistry,Physical chemistry


● Limited to transparent sample and single wavelength measurement. Poor signal to noise ratio


● Spectroscopic evaluations with a nanometer spatial resolution are possible
● Extended from single channel measurements to multiplex measurements
● Wide spectral range with highly accurate measurements are achievable
● Applicable to opaque samples as well as transparent ones


● Super-resolution beyond the diffraction limit is achievable
● Evaluation of material properties with wide spectral range
● Applicable  to a conventional apparatus


High contrast imaging with a nanometer spatial resolution is  possible even for opaque samples


  • Comparison of near-field reflection spectra taken by conventional and developed microscopes
  • Comparison of near-field reflection images taken by conventional and developed microscopes
  • Comparison between observed and calculated spectra

collaborative researchers

溝端 秀聡 (理工学術院 化学・生命化学科)

same researcher's seeds

  • Observing substances under a near-field optical microscope
  • The controlling of light energy with precious metal nanoparticles (plasmonic substances)
  • Fabrication of nano-optical patterns by electron beam irradiation
posted: 2016/02/03